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1

Evaluation of RF electrostatic discharge (ESD) protection in 0.18-μm CMOS technology

Xiaoyang Du, Shurong Dong, Yan Han, Juin J. Liou, Mingxu Huo, You Li, Qiang Cui, Dahai Huang, Demiao Wang

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 360 KB

english, 2008

2

A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters

Ortiz-Conde, Adelmo, Sucre-González, Andrea, Zárate-Rincón, Fabián, Torres-Torres, Reydezel, Murphy-Arteaga, Roberto S., Liou, Juin J., García-Sánchez, Francisco J.

Journal:

Microelectronics Reliability

Year:

2017

Language:

english

File:

PDF, 3.31 MB

english, 2017

3

[IEEE 2018 7th International Symposium on Next Generation Electronics (ISNE) - Taipei, Taiwan (2018.5.7-2018.5.9)] 2018 7th International Symposium on Next Generation Electronics (ISNE) - 2×VDD-tolerant ESD detection circuit in a 90-nm low-voltage CMOS process

Yang, Zhaonian, Zhang, Yue, Yu, Ningmei, Liou, Juin J.

Year:

2018

Language:

english

File:

PDF, 430 KB

english, 2018

4

A low power trimming-free CMOS relaxation oscillator with process and temperature compensation

Wang, Yao, Yao, Mengmeng, Wu, Zhaolei, Sun, Lijun, Liou, Juin Jei

Journal:

Modern Physics Letters B

Year:

2020

Language:

english

File:

PDF, 1.40 MB

english, 2020

5

An analytical threshold voltage model of NMOSFETs with hot-carrier induced interface charge effect

C.S. Ho, Kuo-Yin Huang, Ming Tang, Juin J. Liou

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 241 KB

english, 2005

6

Revisiting MOSFET threshold voltage extraction methods

Ortiz-Conde, Adelmo, García-Sánchez, Francisco J., Muci, Juan, Terán Barrios, Alberto, Liou, Juin J., Ho, Ching-Sung

Journal:

Microelectronics Reliability

Year:

2013

Language:

english

File:

PDF, 1.46 MB

english, 2013

7

vfTLP-VTH: A new method for quantifying the effectiveness of ESD protection for the CDM classification test

Zhou, Yuanzhong, Ellis, David, Hajjar, Jean-Jacques, Olney, Andrew, Liou, Juin J.

Journal:

Microelectronics Reliability

Year:

2013

Language:

english

File:

PDF, 985 KB

english, 2013

8

Compact failure modeling for devices subject to electrostatic discharge stresses – A review pertinent to CMOS reliability simulation

Miao, Meng, Zhou, Yuanzhong, Salcedo, Javier A., Hajjar, Jean-Jacques, Liou, Juin J.

Journal:

Microelectronics Reliability

Year:

2015

Language:

english

File:

PDF, 1.65 MB

english, 2015

9

Investigation of diode geometry and metal line pattern for robust ESD protection applications

You Li, Juin J. Liou, Jim Vinson

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 163 KB

english, 2008

10

RF transistors: Recent developments and roadmap toward terahertz applications

Frank Schwierz, Juin J. Liou

Journal:

Solid-State Electronics

Year:

2007

Language:

english

File:

PDF, 284 KB

english, 2007

11

Silicon controlled rectifier (SCR) compact modeling based on VBIC and Gummel–Poon models

Lifang Lou, Juin J. Liou, Shurong Dong, Yan Han

Journal:

Solid-State Electronics

Year:

2009

Language:

english

File:

PDF, 950 KB

english, 2009

12

Optimization of on-chip ESD protection structures for minimal parasitic capacitance

Xiaofang Gao, Juin J. Liou, Joe Bernier, Gregg Croft, Waisum Wong, Satya Vishwanathan

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 350 KB

english, 2003

13

Statistical modeling of MOS devices for parametric yield prediction

Juin J. Liou, Qiang Zhang, John McMacken, J.Ross Thomson, Kevin Stiles, Paul Layman

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 462 KB

english, 2002

14

RC-Imbedded LDMOS-SCR with High Holding Current for High-Voltage I/O ESD Protection

Liang, Hailian, Gu, Xiaofeng, Dong, Shurong, Liou, Juin

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2015

Language:

english

File:

PDF, 1.17 MB

english, 2015

15

Compact Thermal Failure Model for Devices Subject to Electrostatic Discharge Stresses

Zhou, Yuanzhong, Miao, Meng, Salcedo, Javier A., Hajjar, Jean-Jacques, Liou, Juin J.

Journal:

IEEE Transactions on Electron Devices

Year:

2015

Language:

english

File:

PDF, 4.12 MB

english, 2015

16

Very small snapback silicon-controlled rectifier for electrostatic discharge protection in 28nm processing

Wang, Weihuai, Jin, Hao, Guo, Wei, Dong, Shurong, Liang, Wei, Liou, Juin J., Han, Yan

Journal:

Microelectronics Reliability

Year:

2016

Language:

english

File:

PDF, 1.13 MB

english, 2016

17

Augmented DTSCR With Fast Turn-On Speed for Nanoscale ESD Protection Applications

Du, Feibo, Song, Wenqiang, Hou, Fei, Liu, Jizhi, Liu, Zhiwei, Liou, Juin J., Xiong, Xuanlin, Li, Qingsa, Liu, Yang

Journal:

IEEE Transactions on Electron Devices

Year:

2020

File:

PDF, 2.98 MB

2020

18

Effects of incomplete ionization of impurity dopants on the performance of bipolar junction transistors

Yun Yue, Juin J. Liou

Journal:

Solid-State Electronics

Year:

1996

Language:

english

File:

PDF, 180 KB

english, 1996

19

Indirect fitting procedure to separate the effects of mobility degradation and source-and-drain resistance in MOSFET parameter extraction

Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juan Muci, Denise C. Lugo Muñoz, Álvaro D. Latorre Rey, Ching-Sung Ho, Juin J. Liou

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 367 KB

english, 2009

20

Electro-thermal stress effect on InGaP/GaAs heterojunction bipolar low-noise amplifier performance

Xiang Liu, Jiann-shiun Yuan, Juin J. Liou

Journal:

Microelectronics Reliability

Year:

2010

Language:

english

File:

PDF, 379 KB

english, 2010

21

Effect of the polarity of additional solvent on membrane formation in polysulfone/N-methyl-2-pyrrolidone/water ternary system

Shih-Hsiung Chen, Rey-May Liou, Juin-Yih Lai, Cheng-Lee Lai

Journal:

European Polymer Journal

Year:

2007

Language:

english

File:

PDF, 1.01 MB

english, 2007

22

Preparation and characterizations of asymmetric sulfonated polysulfone membranes by wet phase inversion method

Shih-Hsiung Chen, Rey-May Liou, Yen-Yi Lin, Cheng-Lee Lai, Juin-Yih Lai

Journal:

European Polymer Journal

Year:

2009

Language:

english

File:

PDF, 1.86 MB

english, 2009

23

InGaP/GaAs heterojunction bipolar transistor and RF power amplifier reliability

Liu, Xiang, Yuan, Jiann S., Liou, Juin J.

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 189 KB

english, 2008

24

A new model for four-terminal junction field-effect transistors

Hao Ding, Juin J. Liou, Keith Green, Claude R. Cirba

Journal:

Solid-State Electronics

Year:

2006

Language:

english

File:

PDF, 222 KB

english, 2006

25

A comprehensive and analytical drain current model for pocket-implanted NMOSFETs

C.S. Ho, Juin J. Liou, Gordon Chu, Y.C. Liu

Journal:

Solid-State Electronics

Year:

2004

Language:

english

File:

PDF, 354 KB

english, 2004

26

On-chip electrostatic discharge protection for CMOS gas sensor systems-on-a-chip (SoC)

Javier A. Salcedo, Juin J. Liou, Muhammad Y. Afridi, Allen R. Hefner Jr.

Journal:

Microelectronics Reliability

Year:

2006

Language:

english

File:

PDF, 439 KB

english, 2006

27

Reliability study of ultrathin oxide films subject to irradiation-then-stress treatment using conductive atomic force microscopy

You-Lin Wu, Shi-Tin Lin, Tsung-Min Chang, Juin J. Liou

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 114 KB

english, 2007

28

Integration-based approach to evaluate the sub-threshold slope of MOSFETs

Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juin J. Liou, Ching-Sung Ho

Journal:

Microelectronics Reliability

Year:

2010

Language:

english

File:

PDF, 366 KB

english, 2010

29

Determination of gate-bias dependent source/drain series resistance and effective channel length for advanced MOS devices

C.S. Ho, Y.C. Lo, Y.H. Chang, Juin J. Liou

Journal:

Solid-State Electronics

Year:

2006

Language:

english

File:

PDF, 233 KB

english, 2006

30

An improved junction capacitance model for junction field-effect transistors

Hao Ding, Juin J. Liou, Claude R. Cirba, Keith Green

Journal:

Solid-State Electronics

Year:

2006

Language:

english

File:

PDF, 180 KB

english, 2006

31

Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs

Juin J. Liou, R. Shireen, A. Ortiz-Conde, F.J. Garcı́a Sánchez, A. Cerdeira, X. Gao, Xuecheng Zou, C.S. Ho

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 397 KB

english, 2002

32

Self-protection capability of integrated NLDMOS power arrays in ESD pulse regimes

Blerina Aliaj, Vladislav A. Vashchenko, Andrei Shibkov, Juin J. Liou

Journal:

Microelectronics Reliability

Year:

2011

Language:

english

File:

PDF, 3.29 MB

english, 2011

33

A fully on-chip ESD protection UWB-band low noise amplifier using GaAs enhancement-mode dual-gate pHEMT technology

Hsien-Chin Chiu, Chia-Shih Cheng, Hsuan-Ling Kao, Jeffrey S. Fu, Qiang Cui, Juin J. Liou

Journal:

Microelectronics Reliability

Year:

2011

Language:

english

File:

PDF, 848 KB

english, 2011

34

Thermal reliability of VCO using InGaP/GaAs HBTs

Xiang Liu, Jiann-shiun Yuan, Juin J. Liou

Journal:

Microelectronics Reliability

Year:

2011

Language:

english

File:

PDF, 483 KB

english, 2011

35

Modeling of On-Chip Differential Inductors and Transformers/Baluns

Ji Chen, Juin J. Liou

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 511 KB

english, 2007

36

Design optimization of SiGe BiCMOS Silicon Controlled Rectifier for Charged Device Model (CDM) protection applications

Cui, Qiang, Parthasarathy, Srivatsan, Salcedo, Javier A., Liou, Juin J., Hajjar, Jean J., (Paul) Zhou, Yuanzhong

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 2.18 MB

english, 2014

37

[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Prediction of Gate Dielectric Breakdown in the CDM timescale utilizing very fast transmission line pulsing

Ellis, David F., Malobabic, Slavica, Liou, Juin J., Hajjar, Jean-Jacques

Year:

2009

Language:

english

File:

PDF, 247 KB

english, 2009

38

Novel ESD protection solution for single-ended mixer in GaAs pHEMT technology

Cui, Qiang, Zhang, Shuyun, Liou, Juin J.

Journal:

Microelectronics Reliability

Year:

2013

Language:

english

File:

PDF, 929 KB

english, 2013

39

Reference voltage generation scheme enhancing speed and reliability for 1T1C-type FRAM

Jia, Ze, Liou, Juin J., Liu, Zhiwei, Zhang, Gong, Liu, Jizhi

Journal:

Electronics Letters

Year:

2014

Language:

english

File:

PDF, 436 KB

english, 2014

40

[IEEE 2010 IEEE International Conference of Electron Devices and Solid- State Circuits (EDSSC) - Hong Kong (2010.12.15-2010.12.17)] 2010 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Electrostatic discharge (ESD): A spoiler to development of next-generation technologies?

Year:

2010

Language:

english

File:

PDF, 1.17 MB

english, 2010

41

[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Design analysis of novel substrate-triggered GGNMOS in 65nm CMOS process

Bo Song,, Han, Yan, Mingliang Li,, Liou, Juin J., Dong, Shurong, Wei Guo,, Huang, Dahai, Fei Ma,, Meng Miao,

Year:

2010

Language:

english

File:

PDF, 433 KB

english, 2010

42

High-Robustness and Low-Capacitance Silicon-Controlled Rectifier for High-Speed I/O ESD Protection

Cui, Qiang, Salcedo, Javier A., Parthasarathy, Srivatsan, Zhou, Yuanzhong, Liou, Juin J., Hajjar, Jean J.

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 656 KB

english, 2013

43

[IEEE 2006 International Workshop on Nano CMOS (IWNC) - Mishima, Japan (2006.01.30-2006.02.1)] 2006 International Workshop on Nano CMOS - CMOS technology-based spiral inductors for RF applications

Ji Chen,, Liou, Juin J.

Year:

2006

Language:

english

File:

PDF, 48 KB

english, 2006

44

[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Evaluation of nanowire field-effect transistors for electrostatic discharge (ESD) applications

Liu, Wen, Liou, Juin J., You Li,, Chung, J., Jeong, Y. H.

Year:

2010

Language:

english

File:

PDF, 431 KB

english, 2010

45

[IEEE 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011) - Incheon, Korea (South) (2011.07.4-2011.07.7)] 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Investigation of organic thin-film transistors for electrostatic discharge applications

Liou, Juin J., Wen Liu,, Kuribara, Kazunori, Fukuda, Kenjiro, Sekitani, Tsuyoshi, Someya, Takao, Luo, Sirui

Year:

2011

Language:

english

File:

PDF, 247 KB

english, 2011

46

Nanoscale Bias-Annealing Effect in Postirradiated Thin Silicon Dioxide Films Observed by Conductive Atomic Force Microscopy

Wu, You-Lin, Lin, Shi-Tin, Chang, Tsung-Min, Liou, Juin J.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2007

Language:

english

File:

PDF, 215 KB

english, 2007

47

High-Holding-Voltage Silicon-Controlled Rectifier for ESD Applications

Dong, Shurong, Wu, Jian, Miao, Meng, Zeng, Jie, Han, Yan, Liou, Juin J.

Journal:

IEEE Electron Device Letters

Year:

2012

Language:

english

File:

PDF, 970 KB

english, 2012

48

[IEEE 2007 IEEE Conference on Electron Devices and Solid-State Circuits - Tainan, Taiwan (2007.12.20-2007.12.22)] 2007 IEEE Conference on Electron Devices and Solid-State Circuits - A Novel and Robust Un-Assisted, Low-Trigger and High-Holding Voltage SCR (uSCR) for Area-Efficient On-Chip ESD Protection

Lou, Lifang, Liou, Juin J.

Year:

2007

Language:

english

File:

PDF, 3.06 MB

english, 2007

49

An Unassisted, Low Trigger-, and High Holding-Voltage SCR (uSCR) for On-Chip ESD-Protection Applications

Lou, Lifang, Liou, Juin J.

Journal:

IEEE Electron Device Letters

Year:

2007

Language:

english

File:

PDF, 297 KB

english, 2007

50

[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Characterization of transient behavior and failure mechanism of polysilicon-bound diode under CDM-like very-fast transmission line pulsing

Li, You, Liou, Juin J., Wen Liu,

Year:

2010

Language:

english

File:

PDF, 292 KB

english, 2010

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